搜索资源列表
Atool
- A tool portfolio elimination mechanism (TPEM) for a wafer fab
SCommTest
- 通过串口控制FPGA晶圆测试电路的软件，用于学生做相关实验-FPGA through the serial control circuit wafer testing software for students to do experiments
02MemRepair
- 内存修改，用该进程可以修改内存中的数据，如在金山游侠中可以修改选手的生命值等-Redundancy Repair is a process step almost exclusively used for memory chips. The best way to think of this is via the analogy of the spare wheel in a car. The spare is a redundant fifth wheel carried and used i
OP07_a
- The OP07 has very low input offset voltage (75 μV max for OP07E) which is obtained by trimming at the wafer stage. These low offset voltages generally eliminate any need for external nulling. The OP07 also features low input bias current (±4 nA
eM_P
- eM_Plant虚拟晶圆制造自动组合装置 eM_Plant automatic virtual wafer fabrication assemblies-eM_Plant automatic virtual wafer fabrication assemblies
DSiliconTestee
- 平板缺陷检测，用于lcd、硅硅片缺陷检测等需要实时显示的场合 -Tablet defect detection, for the lcd, the needs of the silicon wafer defect detection and other real-time display of the occasion
SemiMapView
- 用图像显示wafer Mapping，可选择不同Bin的颜色。可按要求分割mapping文件。-Image display wafer Mapping, selectable different colors Bin. Upon request to split the mapping file.
WafermapDisplay-master
- Drawing wafer use windows form
brokenCorner
- 检测晶圆缺角，主要有三种方法：边长检测、面积检测、多边形接近。自己写的，可能有不足，还望批评指正(Detection of wafer deficiency)
die per wafer
- Assignment solution of integrated electronics