搜索资源列表
cpld11245
- 主要介绍了等精度频率测量原理,该原理具有在整个测试频段内保持高精度频率 测量的优点 同时在该原理基础上,采用了Verilog HDL语言设计了高速的等精度测频 模块,并且利用EDA开发平台QUARTUS11 3 .0对CPLD芯片进行写人,实现了计数等 主要逻辑功能 还使用C语言设计了该等精度频率计的主控程序以提高测量精度。本设 计实现了对频率变化范围较大的信号进行频率测量,能够满足高速度、高精度的测频要 求。-Introduced, such as the accuracy
at45db081test
- at45db081测试程序,实现单片机与该芯片的数据流通信情况;-at45db081 testing procedures, to achieve single-chip with the chip data flow communication situation
IS62LV1024test
- IS62LV1024测试程序,实现该芯片的所有功能;-IS62LV1024 test procedure, the realization of all the features of the chip
123
- 时代民芯芯片测试程序,简单的很,可以测试芯片是否工作正常。-Era of public core chip test procedure is simple, you can test the chip is working properly.
c8051_test_at25f512_program
- 基于c8051平台,at25f512flash芯片测试程序-C8051-based platform, at25f512flash chip test program
d3242fbd344d4535957e3fe05e8a8af0
- 求虚拟表(芯片测试)V2.7.1 这个程序的源代码,有的私信我,重重酬谢,或者有类似虚拟表的源代码也可以-For virtual table (chip) V2.7.1 the program s source code, some direct messages me, many thanks, or a similar source code can also be a virtual table
wtc6208bsi_Test
- wtc6208bsi触摸芯片测试程序,基于STC15系列单片机,以C语言编写,注释非常清晰明了-wtc6208bsi touch chip testing procedures, based STC15 series microcontroller, written in C, comments are very clear
ST7565P芯片初始化
- 能够对ST7565P类点阵类液晶进行调试(Able to debug ST7565P class lattice liquid crystal)
芯片手册
- 芯片,英文为Chip;芯片组为Chipset。芯片一般是指集成电路的载体,也是集成电路经过设计、制造、封装、测试后的结果,通常是一个可以立即使用的独立的整体。“芯片”和“集成电路”这两个词经常混着使用,比如在大家平常讨论话题中,集成电路设计和芯片设计说的是一个意思,芯片行业、集成电路行业、IC行业往往也是一个意思。实际(Chip, chip for chip in Chipset. Chip generally refers to the carrier of the integrated ci
dac7744测试
- 16位DAC芯片DAC7744测试程序,可以测试DAC7744是否是好的,用示波器观察输出波形(16 bit DAC chip DAC7744 test program)
136-串转并数字芯片测试
- 136-串转并数字芯片测试(136- serial conversion and digital chip test)
137-非门数字芯片测试
- 137-非门数字芯片测试(A digital 137- chip test)
Test_IIC
- STM32IIC测试BS116A-3芯片(BS116A-3 chip for STM32IIC testing)
TLV5610-数采板程序 PDF
- 一份16位8路DAC模块的测试程序,所用芯片为TLV5610(16 bit eight - way DAC module test program)
9G45DDRtest
- 裸板基于9G45的DDR测试样例,可用户判断DDR的空间大小,读写数据完整性,硬件片选是否正确,多颗DDR芯片硬件组合是否正确,硬件线路是否完整,DDR线路时序是否正常。(DDR bare board test case based on 9G45, the user can determine the DDR size of the space, read and write data integrity, hardware selection is correct, a plurality
RN7302测试例程
- 编程学习,芯片学习适用于RN7302电能计量芯片等使用和测试(PROGRAMMING learning)
Sample_Code
- 测试n76e003功能,方便使用N76E003芯片,代码通过ISP通信,可以用于N76E003于无线发送模块链接(Test the n76e003 function to facilitate the use of n76e003 chip. The code can be used for n76e003 in the wireless transmission module link via ISP communication.)
ADE7878Test
- 电能质量测试芯片的驱动,寄存器,源程序,底层驱动(Power quality test chip driver, register, source code.)
AD9833 STM32 测试程序
- 运用AD9833芯片实现不同频率正弦波、三角波、方波的的产生,误差在0.1%。(Using AD9833 chip to generate sine wave, triangle wave and square wave with different frequencies, the error is 0.1%)
rgmii_image
- 通过RGMII协议驱动的PHY芯片完成千兆以太网收发,包括ARP响应(With RGMII driving PHY IC to finish the internet communication)