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time
- 电源老化房老化测试定时器 望大家有用
TV_power_tester
- MCU控制继电器做的电源老化测试程序.每次测100次-MCU Control Relay aging power to do testing procedures. Each measuring 100 times
Tcontrol
- 应用于各种环境任意长度开关定时应用程序,可用于控制设备老化测试,可变PWM输出等-Used in a variety of environmental applications开关定时arbitrary length can be used to control equipment aging test, a variable, such as PWM output. .
swash
- 电源冲激程序,实现对开关电源的老化测试,进行管控。很适合对电子器实行动态老化。-Power impulse process, to achieve the aging of the switching power supply testing, to regulate them. Very suitable for the kind of dynamic aging of electronic devices.
JZCS
- 基于单片机晶振老化测试(包含单片机和cpld间的通信)-Crystal aging test based on single chip (including the communication between the microcontroller and cpld)
led-module_test_system
- led显示屏动态和静态屏模组老化系统测试程序,实现动静态屏的横扫,竖扫,灰度控制,模组PCB电子点数显示连接方法,并痛过红外实现开关控制,有注释-led module aging system
SPDC-TR
- 这是DC/DC电源模块老化测试台的下位机程序,包含上下位机通讯协议。主控为51单片机,C语言,CAN通讯,非常有用。-This is a DC/DC power module aging test bench lower machine procedures, including upper and lower computer communication protocol. Master 51 microcontroller, C language, CAN communication, ve
HW-1600&2000
- 设备老化,实现往复运动的老化,测试结构元件寿命(the aging of equipment)