控制吉时利公司的CV590设备，来测试半导体器件以及分立器件的电容及电导程序及算法。-control CV590 intruments to measure capacitor and conductor of wafer or capacitor.

实现了Jedec标准中对超薄膜氧化层的MOS电容的Time-zero可靠性测试方法。可直接用于半导体器件可靠性测试中-a realization of Time-zero dilectric breakdown according to Jedec standard,which can use to achieve reliability of wafer

一款测试电容和光电流的程序,本程序已经在工业应用中批量使用-to test the current and cap