基于labview的IC图像缺陷检测.通过匹配得到IC的相对坐标,然后通过边缘发现得到各个引脚之间的位置,最后测量各个引脚之间的距离实现IC缺陷类型(弯曲/断裂等)-IC image defect detection based on labview By matching obtain relative coordinates of the IC, and then found between each pin position obtained through the edge, and f