文件名称:FPGAcuncuqi
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- 上传时间:2012-11-16
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信息技术的发展,特别是各种数字处理器件处理速度的提高,实时处理大量的数据已经成为现实。但是,在一些恶劣环境和数据无法进行实时传输的情况下,还必须用到存储测试的方法。存储测试是指在对被测对象无影响或影响在允许的范围条件下,在被测体内置入微型存储测试系统,现场实时完成信息快速采集与存储,事后对存储器进行回收,由计算机处理和再现被测信息的一种动态测试技术。针对具体的情况,我们研制开 -Development of information technology, especially in a variety of digital processing devices increase in processing speed, real-time processing large amounts of data has become a reality. However, in some harsh environments and real-time transmission of data can not be the case, they must be used in storage testing. Storage test is no effect on the measured object or affect the extent allowed under the conditions tested in vivo implantation in mini-storage test systems, on-site in real-time information quickly capture and storage, and afterwards to recall the memory from the computer processing and reproduce the measured information in a dynamic testing technology. Specific situations, we have developed to open
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基于FPGA的高速数据采集存储系统的设计.docx
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