BIST for RAMs using ASTRA:

Transparent Built-In Self Test (BIST) schemes for RAM modules assure the preservation of the memory contents during periodic testing. Symmetric transparent BIST skips the signature prediction phase required in traditional transparent BIST schemes, achieving considerable reduction in test time. In symmetric transparent BIST schemes proposed to date, output data compaction is performed using either single-input or multiple-input shift registers whose characteristic polynomials are modified during testing. In this project, the utilization of accumulator modules for output data compaction in symmetric transparent BIST for RAMs is proposed. In this project, it has been demonstrated that accumulator based compaction scheme