文件名称:adc_test
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- 上传时间:2012-11-16
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51系列之2430芯片的模数转换测试例程。
需要在IAR开发环境下编译调试。-51 series of 2430 chip ADC test routines. IAR development environment needs to compile debugging.
需要在IAR开发环境下编译调试。-51 series of 2430 chip ADC test routines. IAR development environment needs to compile debugging.
(系统自动生成,下载前可以参看下载内容)
下载文件列表
adc_test/adc_test.c
adc_test/adc_test.c.bak
adc_test/adc_test.dep
adc_test/adc_test.ewd
adc_test/adc_test.ewp
adc_test/adc_test.ewp.bak
adc_test/adc_test.eww
adc_test/adc_test.eww.bak
adc_test/Debug/Exe/adc_test.d51
adc_test/Debug/Obj/adc_test.pbd
adc_test/Debug/Obj/adc_test.r51
adc_test/hal.h
adc_test/settings/adc_test.cspy.bat
adc_test/settings/adc_test.dbgdt
adc_test/settings/adc_test.dni
adc_test/settings/adc_test.wsdt
adc_test/Debug/Exe
adc_test/Debug/List
adc_test/Debug/Obj
adc_test/Debug
adc_test/settings
adc_test
adc_test/adc_test.c.bak
adc_test/adc_test.dep
adc_test/adc_test.ewd
adc_test/adc_test.ewp
adc_test/adc_test.ewp.bak
adc_test/adc_test.eww
adc_test/adc_test.eww.bak
adc_test/Debug/Exe/adc_test.d51
adc_test/Debug/Obj/adc_test.pbd
adc_test/Debug/Obj/adc_test.r51
adc_test/hal.h
adc_test/settings/adc_test.cspy.bat
adc_test/settings/adc_test.dbgdt
adc_test/settings/adc_test.dni
adc_test/settings/adc_test.wsdt
adc_test/Debug/Exe
adc_test/Debug/List
adc_test/Debug/Obj
adc_test/Debug
adc_test/settings
adc_test
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