文件名称:003
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针对颗粒显微图象的性质,提出分块曲面二值化方
法,能有效地消除数据采集时显微镜的光照不均匀,也能有
效地消除颗粒显微图象的噪声,且二值化所产生的图象质量
好。已成功地应用到颗粒显微图象分析系统中。-Particle microscopic image of the nature of the proposed block surfaces binarization method can effectively eliminate the uneven illumination microscope data acquisition particle microscopic image can effectively eliminate the noise, and binarizing The image quality is good. Has been successfully applied to the the particle microscopic image analysis system.
法,能有效地消除数据采集时显微镜的光照不均匀,也能有
效地消除颗粒显微图象的噪声,且二值化所产生的图象质量
好。已成功地应用到颗粒显微图象分析系统中。-Particle microscopic image of the nature of the proposed block surfaces binarization method can effectively eliminate the uneven illumination microscope data acquisition particle microscopic image can effectively eliminate the noise, and binarizing The image quality is good. Has been successfully applied to the the particle microscopic image analysis system.
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