文件名称:DA_TEST
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- 上传时间:2014-04-13
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文件大小:54.29kb
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针对TI生产DSP芯片的学习程序,采用TMS320LF2407 EVM评估板,开发环境是CCS3.3,用于DA变换学习。-TI DSP chips for the production of the learning process, using TMS320LF2407 EVM evaluation board, development environment is CCS3.3, DA conversion for learning.
(系统自动生成,下载前可以参看下载内容)
下载文件列表
DA_TEST/cc_build_Debug.log
DA_TEST/da_test.paf
DA_TEST/da_test.pjt
DA_TEST/Debug/da_test.map
DA_TEST/Debug/da_test.out
DA_TEST/Debug/high_speed_da.obj
DA_TEST/Debug/vectors.obj
DA_TEST/Debug.lkf
DA_TEST/Debug.lkv
DA_TEST/HIGH_SPEED_DA.c
DA_TEST/math.h
DA_TEST/rts2xx.lib
DA_TEST/tms320lf2407.h
DA_TEST/tms320lf2407_evm.cmd
DA_TEST/vectors.asm
DA_TEST/说明.txt
DA_TEST/Debug
DA_TEST
DA_TEST/da_test.paf
DA_TEST/da_test.pjt
DA_TEST/Debug/da_test.map
DA_TEST/Debug/da_test.out
DA_TEST/Debug/high_speed_da.obj
DA_TEST/Debug/vectors.obj
DA_TEST/Debug.lkf
DA_TEST/Debug.lkv
DA_TEST/HIGH_SPEED_DA.c
DA_TEST/math.h
DA_TEST/rts2xx.lib
DA_TEST/tms320lf2407.h
DA_TEST/tms320lf2407_evm.cmd
DA_TEST/vectors.asm
DA_TEST/说明.txt
DA_TEST/Debug
DA_TEST
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