文件名称:Irdeto-CT1642-FD650-Cb12-PT8211-Test
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- 上传时间:2012-10-17
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文件大小:1.13mb
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已下载:2次
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Irdeto CT1642 FD650 Cb12 PT8211 测试,
其中Irdeto只测试ATR信号,CT1642和FD650驱动LED数码管,Cb12是红外编码单片机,PT8211是音频DAC-Irdeto CT1642 FD650 Cb12 PT8211 test, which tests only Irdeto ATR signal, CT1642 and FD650 drive LED digital tube, Cb12 is encoded infrared chip, PT8211 is an audio DAC
其中Irdeto只测试ATR信号,CT1642和FD650驱动LED数码管,Cb12是红外编码单片机,PT8211是音频DAC-Irdeto CT1642 FD650 Cb12 PT8211 test, which tests only Irdeto ATR signal, CT1642 and FD650 drive LED digital tube, Cb12 is encoded infrared chip, PT8211 is an audio DAC
(系统自动生成,下载前可以参看下载内容)
下载文件列表
SW/FCP_CA_TEST/Test_CA_Cb_FD_CT_IR_BT_Run_Count/BUG.TXT
SW/FCP_CA_TEST/Test_CA_Cb_FD_CT_IR_BT_Run_Count/Download.e2s
SW/FCP_CA_TEST/Test_CA_Cb_FD_CT_IR_BT_Run_Count/Clear.cmd
SW/FCP_CA_TEST/Test_CA_Cb_FD_CT_IR_BT_Run_Count/FD650o.C
SW/FCP_CA_TEST/Test_CA_Cb_FD_CT_IR_BT_Run_Count/FD650o.H
SW/FCP_CA_TEST/Test_CA_Cb_FD_CT_IR_BT_Run_Count/FD650o_IO.H
SW/FCP_CA_TEST/Test_CA_Cb_FD_CT_IR_BT_Run_Count/Timer2.H
SW/FCP_CA_TEST/Test_CA_Cb_FD_CT_IR_BT_Run_Count/ICCAVRMACRO.H
SW/FCP_CA_TEST/Test_CA_Cb_FD_CT_IR_BT_Run_Count/Irdeto.H
SW/FCP_CA_TEST/Test_CA_Cb_FD_CT_IR_BT_Run_Count/Main.prj
SW/FCP_CA_TEST/Test_CA_Cb_FD_CT_IR_BT_Run_Count/Main.SRC
SW/FCP_CA_TEST/Test_CA_Cb_FD_CT_IR_BT_Run_Count/ST8024_IO.H
SW/FCP_CA_TEST/Test_CA_Cb_FD_CT_IR_BT_Run_Count/Timer0.H
SW/FCP_CA_TEST/Test_CA_Cb_FD_CT_IR_BT_Run_Count/USART.H
SW/FCP_CA_TEST/Test_CA_Cb_FD_CT_IR_BT_Run_Count/USART.C
SW/FCP_CA_TEST/Test_CA_Cb_FD_CT_IR_BT_Run_Count/CB12.H
SW/FCP_CA_TEST/Test_CA_Cb_FD_CT_IR_BT_Run_Count/EXT_INT.H
SW/FCP_CA_TEST/Test_CA_Cb_FD_CT_IR_BT_Run_Count/ICCAVRIO.H
SW/FCP_CA_TEST/Test_CA_Cb_FD_CT_IR_BT_Run_Count/IR_NEC_Decoder.H
SW/FCP_CA_TEST/Test_CA_Cb_FD_CT_IR_BT_Run_Count/Timer1.H
SW/FCP_CA_TEST/Test_CA_Cb_FD_CT_IR_BT_Run_Count/Main.hex
SW/FCP_CA_TEST/Test_CA_Cb_FD_CT_IR_BT_Run_Count/FD650.C
SW/FCP_CA_TEST/Test_CA_Cb_FD_CT_IR_BT_Run_Count/FD650.H
SW/FCP_CA_TEST/Test_CA_Cb_FD_CT_IR_BT_Run_Count/FD650_IO.H
SW/FCP_CA_TEST/Test_CA_Cb_FD_CT_IR_BT_Run_Count/CT1642_IO.H
SW/FCP_CA_TEST/Test_CA_Cb_FD_CT_IR_BT_Run_Count/CT1642.H
SW/FCP_CA_TEST/Test_CA_Cb_FD_CT_IR_BT_Run_Count/CT1642.C
SW/FCP_CA_TEST/Test_CA_Cb_FD_CT_IR_BT_Run_Count/EEPROM.H
SW/FCP_CA_TEST/Test_CA_Cb_FD_CT_IR_BT_Run_Count/Main.C
SW/FCP_CA_TEST/Test_CA_Cb_FD_CT_IR_BT_Run_Count/Main_
SW/FCP_CA_TEST/Test_CA_Cb_FD_CT_IR_BT_Run_Count/Download.e2s
SW/FCP_CA_TEST/Test_CA_Cb_FD_CT_IR_BT_Run_Count/Clear.cmd
SW/FCP_CA_TEST/Test_CA_Cb_FD_CT_IR_BT_Run_Count/FD650o.C
SW/FCP_CA_TEST/Test_CA_Cb_FD_CT_IR_BT_Run_Count/FD650o.H
SW/FCP_CA_TEST/Test_CA_Cb_FD_CT_IR_BT_Run_Count/FD650o_IO.H
SW/FCP_CA_TEST/Test_CA_Cb_FD_CT_IR_BT_Run_Count/Timer2.H
SW/FCP_CA_TEST/Test_CA_Cb_FD_CT_IR_BT_Run_Count/ICCAVRMACRO.H
SW/FCP_CA_TEST/Test_CA_Cb_FD_CT_IR_BT_Run_Count/Irdeto.H
SW/FCP_CA_TEST/Test_CA_Cb_FD_CT_IR_BT_Run_Count/Main.prj
SW/FCP_CA_TEST/Test_CA_Cb_FD_CT_IR_BT_Run_Count/Main.SRC
SW/FCP_CA_TEST/Test_CA_Cb_FD_CT_IR_BT_Run_Count/ST8024_IO.H
SW/FCP_CA_TEST/Test_CA_Cb_FD_CT_IR_BT_Run_Count/Timer0.H
SW/FCP_CA_TEST/Test_CA_Cb_FD_CT_IR_BT_Run_Count/USART.H
SW/FCP_CA_TEST/Test_CA_Cb_FD_CT_IR_BT_Run_Count/USART.C
SW/FCP_CA_TEST/Test_CA_Cb_FD_CT_IR_BT_Run_Count/CB12.H
SW/FCP_CA_TEST/Test_CA_Cb_FD_CT_IR_BT_Run_Count/EXT_INT.H
SW/FCP_CA_TEST/Test_CA_Cb_FD_CT_IR_BT_Run_Count/ICCAVRIO.H
SW/FCP_CA_TEST/Test_CA_Cb_FD_CT_IR_BT_Run_Count/IR_NEC_Decoder.H
SW/FCP_CA_TEST/Test_CA_Cb_FD_CT_IR_BT_Run_Count/Timer1.H
SW/FCP_CA_TEST/Test_CA_Cb_FD_CT_IR_BT_Run_Count/Main.hex
SW/FCP_CA_TEST/Test_CA_Cb_FD_CT_IR_BT_Run_Count/FD650.C
SW/FCP_CA_TEST/Test_CA_Cb_FD_CT_IR_BT_Run_Count/FD650.H
SW/FCP_CA_TEST/Test_CA_Cb_FD_CT_IR_BT_Run_Count/FD650_IO.H
SW/FCP_CA_TEST/Test_CA_Cb_FD_CT_IR_BT_Run_Count/CT1642_IO.H
SW/FCP_CA_TEST/Test_CA_Cb_FD_CT_IR_BT_Run_Count/CT1642.H
SW/FCP_CA_TEST/Test_CA_Cb_FD_CT_IR_BT_Run_Count/CT1642.C
SW/FCP_CA_TEST/Test_CA_Cb_FD_CT_IR_BT_Run_Count/EEPROM.H
SW/FCP_CA_TEST/Test_CA_Cb_FD_CT_IR_BT_Run_Count/Main.C
SW/FCP_CA_TEST/Test_CA_Cb_FD_CT_IR_BT_Run_Count/Main_
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