查看会员资料
用 户 名：shan*****
发送消息- Email：用户隐藏
- Icq/MSN：
- 电话号码：
- Homepage：
- 会员简介：
最新会员发布资源
vhdl-all-english
- A major obstacle that stands in the way of efficient test response compaction are the unknown values (x-values) captured by scan cells during testing. If test responses with s and the correctness of the compactor inputs cannot be verified at