文件名称:vhdl-all-english
-
所属分类：
- 标签属性：
- 上传时间：2014-03-07
-
文件大小：557.04kb
-
已下载：0次
-
提 供 者：
-
相关连接：无下载说明：别用迅雷下载，失败请重下，重下不扣分！
介绍说明－－下载内容来自于网络，使用问题请自行百度
A major obstacle that stands in the way of efficient test
response compaction are the unknown values (x-values) captured
by scan cells during testing. If test responses with
s and the correctness of the
compactor inputs cannot be verified at the c
limited compaction rates
response compaction are the unknown values (x-values) captured
by scan cells during testing. If test responses with
s and the correctness of the
compactor inputs cannot be verified at the c
limited compaction rates
(系统自动生成,下载前可以参看下载内容)
下载文件列表
vhdl-all-english.pdf
本网站为编程资源及源代码搜集、介绍的搜索网站，版权归原作者所有！ 粤ICP备11031372号
1999-2046 搜珍网 All Rights Reserved.